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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization Hardcover - 1990

by Dieter K. Schroder


Details

  • Title Semiconductor Material and Device Characterization
  • Author Dieter K. Schroder
  • Binding Hardcover
  • Edition First Edition; F
  • Pages 624
  • Volumes 1
  • Language ENG
  • Publisher Wiley-Interscience, New York
  • Date 1990
  • ISBN 9780471511045 / 0471511048
  • Weight 2.11 lbs (0.96 kg)
  • Dimensions 9.53 x 6.47 x 1.18 in (24.21 x 16.43 x 3.00 cm)
  • Library of Congress subjects Semiconductors, Semiconductors - Testing
  • Library of Congress Catalog Number 89024881
  • Dewey Decimal Code 621.381
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Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization

by Schroder, Dieter K.

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  • Hardcover
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Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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UsedGood. There is either a name, note, or insciprtion on the inside cover. The pages are sun faded and slightly yellowing. We flipped through this book and didn't notice any notes or underlines. The cover has visible markings and wear. Some corner dings. The dust jacket shows normal wear and tear. The dust jacket has minor damage or small tear. This is a hardcover copy. Fast Shipping - Each order powers our free bookstore in Chicago and sending books to Africa!
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Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization

by Dieter K. Schroder

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  • Hardcover
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Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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Wiley & Sons, Incorporated, John, 1990. Hardcover. Good. Disclaimer:A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. The dust jacket is missing. At ThriftBooks, our motto is: Read More, Spend Less.
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Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization

by Schroder, Dieter K

  • Used
Condition
Used - Good
ISBN 10 / ISBN 13
9780471511045 / 0471511048
Quantity Available
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Wiley & Sons, Incorporated, John. Used - Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization

by Schroder, Dieter K.

  • Used
  • Near Fine
  • Hardcover
Condition
Used - Near Fine
Binding
Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990 hardback book and dust jacket in near fine condition. Hardcover. Near Fine/Near Fine.
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Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization

  • Used
  • Good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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good. hardcover. cover and corner wear. no dust jacket. note on title page. bent cover corners. name on book edge.
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Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization

by Schroder, Dieter K.

  • Used
  • Good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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Semiconductor Material and Device Characterization  - 1st Edition/1st  Printing

Semiconductor Material and Device Characterization - 1st Edition/1st Printing

by Schroder, Dieter K.

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  • Hardcover
  • first
Condition
Used - Near Fine in Near Fine dust jacket
Edition
First Edition; First Printing
Binding
Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
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Summerville, South Carolina, United States
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New York: John Wiley & Sons, Inc.. Near Fine in Near Fine dust jacket. 1990. First Edition; First Printing. Hardcover. 0471511048 . A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo .
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Semiconductor Material and Device Characterization
Stock Photo: Cover May Be Different

Semiconductor Material and Device Characterization

by Schroder, Dieter K

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9780471511045 / 0471511048
Quantity Available
1
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San Diego, California, United States
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Wiley-Interscience, 1990-07-04. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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