Description:
IEEE (Institute of Electrical & Electronics Engineers), Piscataway, N.J, 1997. Paperback. Very Good. 8vo, paperback. Vg condition. Non-circulating ex-lib copy w/ light markings to opening pgs, crossed-out stamps on text-block edges; faint outer smudging, contents bright & clean, binding tight. vi, 384 p. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
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IEEE International Reliability Physics Symposium Paperback - 1998
by IEEE Electron Devices Society; IEEE Industry Applications Society (Editor); Ch&&&&&
Details
- Title IEEE International Reliability Physics Symposium
- Author IEEE Electron Devices Society; IEEE Industry Applications Society (Editor); Ch&&&&&
- Binding Paperback
- Pages 384
- Volumes 1
- Language ENG
- Publisher Institute of Electrical & Electronics Enginee
- Date January 1998
- ISBN 9780780335752 / 0780335759
- Library of Congress Catalog Number 82640313
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1997 IEEE International Reliability Physics Symposium Proceedings: 35th Annual, Denver, Colorado, April 8, 9, 10, 1997 [IEEE Catalog No. 97CH35983]
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- Used - Very Good
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- ISBN 10 / ISBN 13
- 9780780335752 / 0780335759
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1997 IEEE International Reliability Physics Symposium [Hardcover
by IEEE Realibility Society
- Used
- Hardcover
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- Used
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- Hardcover
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- 9780780335752 / 0780335759
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In overall good condition, no pages missing. Shipping can take between 2-6weeks for international deliveries. Hardback copies may or may not have dust jackets, please get in contact for more information.
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1997 IEEE International Reliability Physics Symposium (International Reliability Physics Symposium Proceedings)
by International Reliability Physics Symposium (35th
- Used
- Good
- Hardcover
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- Used - Good
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- Hardcover
- ISBN 10 / ISBN 13
- 9780780335752 / 0780335759
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Newport Coast, California, United States
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SGD 239.91FREE shipping to USA
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hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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SGD 239.91
FREE shipping to USA