Description:
Piscataway, NJ, U.S.A.: Institute of Electrical & Electronics Engineers, Incorporated. Fine with no dust jacket. 1998. First Edition. Original Wraps. 0780343484 . Slight bump to head of spine.; 8x11 1/2" .
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IEEE International Conference on Microelectronic Test Structure Paperback - 1998
by IEEE Electron Devices Society; IEEE; IEEE International Conference on Microel
Details
- Title IEEE International Conference on Microelectronic Test Structure
- Author IEEE Electron Devices Society; IEEE; IEEE International Conference on Microel
- Binding Paperback
- Edition First Edition
- Pages 240
- Volumes 1
- Language ENG
- Publisher Institute of Electrical & Electronics Enginee, Piscataway, NJ, U.S.A.
- Date July 1998
- ISBN 9780780343481 / 0780343484
- Library of Congress Catalog Number 97080476
- Dewey Decimal Code 621.381
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1998 IEEE International Conference on Microelectronic Test Structures
by IEEE, Electron Devices Society Staff; Institute of Electrical and Electronics Engineers, Inc. Staff (editor)
- Used
- Paperback
- first
- Condition
- Used - Fine with no dust jacket
- Edition
- First Edition
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9780780343481 / 0780343484
- Quantity Available
- 1
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Lincoln City, Oregon, United States
- Item Price
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SGD 71.62SGD 6.85 shipping to USA
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1998 International Conference on Microelectronic Test Structure, Icmts [Paperback
by Institute of Electrical and Electronics Engineers
- Used
- Hardcover
- Condition
- Used
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780780343481 / 0780343484
- Quantity Available
- 1
- Seller
-
Maritime Quarter, Swansea, United Kingdom
- Item Price
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SGD 212.21SGD 79.93 shipping to USA
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Description:
In overall good condition, no pages missing. Shipping can take between 2-6weeks for international deliveries. Hardback copies may or may not have dust jackets, please get in contact for more information.
Item Price
SGD 212.21
SGD 79.93
shipping to USA