Skip to content

Design-For-Test for Digital IC's and Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test for Digital IC's and Embedded Core Systems Hardcover - 1999

by Alfred Crouch


Details

  • Title Design-For-Test for Digital IC's and Embedded Core Systems
  • Author Alfred Crouch
  • Binding Hardcover
  • Edition 1st edition
  • Pages 347
  • Volumes 1
  • Language ENG
  • Publisher Prentice Hall, Upper Saddle River, N.J.
  • Date June 15, 1999
  • Illustrated Yes
  • ISBN 9780130848277 / 0130848271
  • Weight 1.33 lbs (0.60 kg)
  • Dimensions 9.18 x 6.98 x 0.85 in (23.32 x 17.73 x 2.16 cm)
  • Library of Congress subjects Electronic circuit design, Digital integrated circuits - Design and
  • Library of Congress Catalog Number 99-23871
  • Dewey Decimal Code 621

About the author

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.

Back to Top

More Copies for Sale

Design-For-Test for Digital Ic's & Embedded Core Systems

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L.

  • Used
  • Good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
Seattle, Washington, United States
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
SGD 10.02
FREE shipping to USA

Show Details

Description:
Prentice Hall, 1999. Hardcover. Good. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
Item Price
SGD 10.02
FREE shipping to USA
Design-For-Test for Digital Ic's & Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L

  • Used
  • Hardcover
Condition
Used: Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
HOUSTON, Texas, United States
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
SGD 14.78
FREE shipping to USA

Show Details

Description:
Prentice Hall, 0000-00-00. hardcover. Used: Good.
Item Price
SGD 14.78
FREE shipping to USA
Design-For-Test for Digital Ic's & Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L

  • Used
  • Very Good
  • Hardcover
Condition
Used - Very Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
GEORGETOWN, Texas, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
SGD 35.76
FREE shipping to USA

Show Details

Description:
Prentice Hall. hardcover. Very Good. 9x1x7. Disk included. Hardcover shows only light cover wear. Text is unmarked and binding tight. Ships FAST!
Item Price
SGD 35.76
FREE shipping to USA
Design-For-Test for Digital Ic's & Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L.

  • Used
  • Good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
Newport Coast, California, United States
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
SGD 75.12
FREE shipping to USA

Show Details

Description:
hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Item Price
SGD 75.12
FREE shipping to USA
Design-For-Test for Digital Ic's & Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test for Digital Ic's & Embedded Core Systems

by Crouch, Alfred L

  • New
  • Paperback
Condition
New
Binding
Paperback
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
San Diego, California, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
SGD 109.51
SGD 7.45 shipping to USA

Show Details

Description:
Prentice Hall. Paperback. New. New. In shrink wrap. Looks like an interesting title!
Item Price
SGD 109.51
SGD 7.45 shipping to USA
Design-For-Test For Digital IC's and Embedded Core Systems
Stock Photo: Cover May Be Different

Design-For-Test For Digital IC's and Embedded Core Systems

by Crouch, Alfred

  • New
  • Hardcover
  • first
Condition
New
Edition
First Edition
Binding
Hardcover
ISBN 10 / ISBN 13
9780130848277 / 0130848271
Quantity Available
1
Seller
Hygiene, Colorado, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
SGD 227.35
SGD 20.44 shipping to USA

Show Details

Description:
Upper Saddle River, N.J.: Prentice Hall, 1999. Comprehensive text introduces the basic concepts of test and design-for-test (DFT), and addresses the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow. Key topics include: Core-based design, focusing on embedded cores and embedded memories. System-on-a-chip and ultra-large scale integrated design issues. AC scan, at-speed scan, and embedded DFT. Built-in self-test, including memory BIST, logic BIST, and… Read More
Item Price
SGD 227.35
SGD 20.44 shipping to USA