Description:
Springer. Very Good. 1999. Hardcover. 0412145618 . This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages .
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Failure Analysis of Integrated Circuits: Tools and Techniques Hardcover - 1999
by Lawrence C. Wagner (Editor)
First line
Failure analysis can be defined as a diagnostic process for determining the cause of a failure.
Details
- Title Failure Analysis of Integrated Circuits: Tools and Techniques
- Author Lawrence C. Wagner (Editor)
- Binding Hardcover
- Edition 1st
- Pages 255
- Volumes 1
- Language ENG
- Publisher Springer
- Date 1999-01-31
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- ISBN 9780412145612 / 0412145618
- Weight 1.3 lbs (0.59 kg)
- Dimensions 9.48 x 6.42 x 0.87 in (24.08 x 16.31 x 2.21 cm)
- Library of Congress subjects Semiconductors - Failures, Integrated circuits - Testing
- Library of Congress Catalog Number 98051769
- Dewey Decimal Code 621.381
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Failure Analysis of Integrated Circuits : Tools and Techniques
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
by Wagner, Lawrence C. [Editor]
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Springer, 1999-01-31. Hardcover. Like New. Binding firm, interior clean and unmarked. A nice copy.
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Failure Analysis of Integrated Circuits: Tools and Techniques
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Springer, 1999. Hardcover. Acceptable. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
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Failure Analysis of Integrated Circuits : Tools and Techniques
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science (494))
by Wagner, Lawrence C. [Editor]
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Springer, 1999-01-31. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
by Wagner, Lawrence C. [Editor]
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