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Iutam Symposium on Size Effects on Material and Structural Behavior at Micron-
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Iutam Symposium on Size Effects on Material and Structural Behavior at Micron- And Nano-Scales: Proceedings of the Iutam Symposium Held in Hong Kong, Hardcover - 2006

by Q. P. Sun (Editor); P. Tong (Editor)


From the publisher

Includes bibliographical references and index.

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  • Title Iutam Symposium on Size Effects on Material and Structural Behavior at Micron- And Nano-Scales: Proceedings of the Iutam Symposium Held in Hong Kong,
  • Author Q. P. Sun (Editor); P. Tong (Editor)
  • Binding Hardcover
  • Edition 1st
  • Pages 272
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Date 2006-08-10
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • ISBN 9781402049453 / 1402049455
  • Weight 1.55 lbs (0.70 kg)
  • Dimensions 9.5 x 6.3 x 0.7 in (24.13 x 16.00 x 1.78 cm)
  • Library of Congress subjects Strength of materials, Nanostructured materials
  • Library of Congress Catalog Number 2007295012
  • Dewey Decimal Code 620.112
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IUTAM SYMPOSIUM ON SIZE EFFECTS ON MATERIAL AND STRUCTURAL BEHAVIOR AT MICRON- AND NANO-SCALES:
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IUTAM SYMPOSIUM ON SIZE EFFECTS ON MATERIAL AND STRUCTURAL BEHAVIOR AT MICRON- AND NANO-SCALES:

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Iutam Symposium on Size Effects on Material and Structural Behavior at Micron- And Nano-Scales: Proceedings of the Iutam Symposium Held in Hong Kong,

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IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales: Proceedings of the IUTAM Symposium held in Hong Kong, China, 31 May - 4 June, 2004

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IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales: Proceedings of the IUTAM Symposium held in Hong Kong, ... 2004 (Solid Mechanics and Its Applications)

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IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales: Proceedings of the IUTAM Symposium held in Hong Kong, ... (Solid Mechanics and Its Applications, 142)

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Iutam Symposium On Size Effects On Material And Structural Behavior At Micron- And Nano-scales:

by Q. P. Sun, P. Tong,

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