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Advanced Trace Analysis Hardcover - 2010

by Susanta Lahiri


From the publisher

Written by eminent scientists, Advanced Trace Analysis, this textbook discusses plethora of topics, including using statistical approaches to verify trace element analysis data, the trace analysis techniques like ICPMS and XRF, ion beam analysis technique and the speciation analysis of uranium relevant to waste disposal and management.

Details

  • Title Advanced Trace Analysis
  • Author Susanta Lahiri
  • Binding Hardcover
  • Edition First
  • Pages 188
  • Volumes 1
  • Language ENG
  • Publisher Narosa Publishing House, New Delhi
  • Date 2010
  • ISBN 9788184870299 / 8184870299
  • Weight 1.3 lbs (0.59 kg)
  • Dimensions 9.45 x 7.28 x 0.6 in (24.00 x 18.49 x 1.52 cm)
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Advanced Trace Analysis

by Lahiri, Susanta

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UsedVeryGood
ISBN 10 / ISBN 13
9788184870299 / 8184870299
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Item Price
SGD 63.56
SGD 4.10 shipping to USA